SEM Magnification Standard and Stage Micrometer MRS-4 - Retainer for MRS-4

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Description

SEM Magnification Standard and Stage Micrometer MRS-4 - Retainer for MRS-4DESCRIPTION Protective Retainer for MRS 3 4, SEM, 1" x 0. 125" (25. 4 x 3. 18mm) with clear hole for transmission measurements. Standard recessed 0. 02" (0. 5mm) The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies

Can be mounted on a stub of your choice of See Mount Selections A-R

5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Aluminum

so substantial tip angle decreases more when it is attached to a chip holder in your AFM with certain tilt angle (probably

The Silicon tip has an extremely sharp 5 nm tip radius

Sharpened Silicon Tip

weather stripping and more

One pack of 10 probes

It is composed of a glass fiber/epoxy composite and carbon fiber/epoxy composite that have been sectioned and polished

Bruker recommends transitioning to this probe

Maximum grain size: 16µm

Comes in sets of two (2)

please use model ScanAsyst-Fluid