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FIB8-60042N m, 320kHz, 10nm Tip Radius, 600nm Wide Spike @ 8m DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 600nm Wide Spike @ 8m High aspect ratio probe based upon Veeco technology and made from our TESP. Aspect ratio of 12: 1 at 8um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 2 0. 5 Back Angle: 2 0. 5 Side Angle: 2 0. 5 Tip Radius (Nom): 10 Tip Radius (Max): 15 Tip Set Back (Nom):

This part is included in the Conductive AFM Option

16 N/m nominal

Every aspect of the RESP design has been optimized to provide the most accurate profiling of microscopic features

B-doped on a p-type substrate

NOTE: While formulated for stability

which makes it easy to determine the 500nm pitch

Sliding cover

2 Cantilever Geometry: Rectangular Cantilevers Number: 1

5 +/- 5 Tip Radius (Nom): 25 Tip Radius (Max): 35 Tilt Compensation: 0 +/- 1

00 Hazardous Handling Fee

Veeco"s SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes

and their combination with PeakForce QNM